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Opto Edu A63.7003 360000x Tungsten Filament Scanning Electron Microscope

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Opto Edu A63.7003 360000x Tungsten Filament Scanning Electron Microscope

Brand Name : CNOEC, OPTO-EDU

Model Number : A63.7003

Certification : CE, Rohs

Place of Origin : China

MOQ : 1 pc

Price : FOB $1~1000, Depend on Order Quantity

Payment Terms : T/T, West Union, Paypal

Supply Ability : 5000 pcs/ Month

Delivery Time : 5~20 Days

Packaging Details : Carton Packing, For Export Transportation

Acceleration voltage : 3-20kV, continuously adjustable

Magnification : ≥360000X

Resolution : ≤4nm

Stage : 5 Axis Motorized Stage

Video mode : ≥512x512 pixels

Image File : BMP, TIFF, JPEG, PNG

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  • Magnification 360000x, Resolution 4nm@20KV(SE) With Detector SE+BSE+CCD, Optional EDS
  • Standard X/Y Motorized Working Stage, Optional Five Axes X/Y/Z/R/T
  • Built-in Condenser No Need Manual Adjust Aperture (LaB6 Optional)
  • High Vaccum System With Mechanical Rotary Pump To Get Vaccum In <2 Minutes
  • One Key Auto Focus, Auto Brightness & Contrast Adjust, No Need Shock Absorbing Table
Opto Edu A63.7003 360000x Tungsten Filament Scanning Electron Microscope
Opto Edu A63.7003 360000x Tungsten Filament Scanning Electron Microscope

A63.7003 Desktop Scanning Electron Microscopes (SEM) incorporate numerous innovative technologies, offering not only excellent imaging performance but also portability, catering to a wide range of application needs. Both domestically and internationally, the ZEM series, with its high-end positioning and diverse models, has achieved advanced standards in imaging clarity, user-friendliness, and system integration.

A63.7003 is renowned for its high level of integration and flexible configuration options. The user interface is simple, easy to learn, and operate, allowing even non-expert users to quickly become proficient. The accompanying software supports the entire workflow, from sample preparation, parameter adjustment, to image analysis, providing an integrated and efficient solution. A63.7003 has demonstrated strong analytical capabilities across multiple fields such as new materials, new energy, biomedicine, and semiconductors, assisting researchers in exploring the mysteries of the microscopic world. Due to its excellent cost-performance ratio, the ZEM series has become a preferred choice for many universities, research institutions, and enterprises seeking a desktop scanning electron microscope.

Opto Edu A63.7003 360000x Tungsten Filament Scanning Electron Microscope
Opto Edu A63.7003 360000x Tungsten Filament Scanning Electron Microscope

▲ Vacuum Separation Technology: Utilizes a unique vacuum design where the electron gun and sample chamber have separate vacuums, allowing for sample change in less than 1 minute.

▲ Extra-Large Sample Chamber: Provides a larger sample storage space for convenient user operation.

▲ Ultra-High Resolution: Achieves a maximum magnification of 360,000 times with a resolution of 5nm at 20kV.

▲ Standard Equipped Deceleration Mode: Allows for the observation of weakly conductive samples without gold sputtering.

▲ In-Chamber Camera: The sample chamber is equipped with a high-definition camera for real-time monitoring of sample changes during in-situ experiments.

Opto Edu A63.7003 360000x Tungsten Filament Scanning Electron Microscope
Opto Edu A63.7003 360000x Tungsten Filament Scanning Electron Microscope

Working Conditions:

Environmental requirements: small size, the whole machine can be placed on an ordinary laboratory table, no need to be equipped with an additional shock absorbing table.

1.Power supply 220V, 50Hz, 1KW

2.Temperature: Operating ambient temperature: 15°C-30°C

3.Humidity: <80%RH

Main Specification:

1. Acceleration voltage: 3-20kV, continuously adjustable.

2. Electron gun type: pre-aligned tungsten filament (user can change by himself), highly integrated two-stage gun lens, no need to manually adjust the diaphragm of the objective lens.

3. Magnification ≥360000X

4. Resolution:≤4nm

5. Detector types: secondary electron detector (SE), quadruple backscatter detector (BSE), integrated energy dispersive instrument

6. 3 Axis Motorized stage moving X≥60mm Y≥55mm

7. Maximum sample size: XY two axes can be moved freely, and the sample size is 100*78*68.5mm.

8. High vacuum mode: fully automatic control, sample change and vacuum pumping time≤ 30s.

9. Vacuum system: built-in turbomolecular pump, external backing pump, the vacuum degree of the sample chamber is better than: 4x10-2Pa.

10. Video mode: ≥512x512 pixels, no need for small window scanning.

11. Quick scan mode: imaging time≤3s, ≥512x512 pixels.

12. Slow scan mode: imaging time≤40s, ≥ 2048x2048 pixels.

13. Image File: BMP, TIFF, JPEG, PNG.

14. Auto function: one-key automatic adjustment of brightness and contrast, auto-focus.

15. Navigation function: optical camera navigation and cabin camera.

16. Image measurement function: distance, angle, etc.

17. Control mode: mouse control.

18. Extended function:

--EDS

--5 Axis Motorized Stage

--Low vacuum (1-60Pa)

--Variety in-situ functional sample stages of the original factory,

--Deceleration Mode, can observe non-conductor or poor conductivity samples without gold spraying

19.Main body size: 650*370*642mm

Opto Edu A63.7003 360000x Tungsten Filament Scanning Electron Microscope


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